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Spdk/test/nvmf/test_plan.md
Karol Latecki 564524a7dd test/nvmf: Add nvmf with lvol integrity test 
Test for veryfing correct interoperability of nvmf with
use of lvol store / lvol bdev backends.

Also added initial test plan in which test is described.

Change-Id: Ided093091847dff2bca76063926798d5606d73bd
Signed-off-by: Karol Latecki <karol.latecki@intel.com>
Reviewed-on: https://review.gerrithub.io/377529
Reviewed-by: Tomasz Zawadzki <tomasz.zawadzki@intel.com>
Reviewed-by: Maciej Szwed <maciej.szwed@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
2017-09-20 14:21:45 -04:00

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SPDK nvmf_tgt test plan

Objective

The purpose of these tests is to verify correct behavior of SPDK NVMeOF feature. These tests are run either per-commit or as nightly tests.

Configuration

All tests share the same basic configuration file for SPDK nvmf_tgt to run. Static configuration from config file consists of setting number of per session queues and enabling RPC for further configuration via RPC calls. RPC calls used for dynamic configuration consist:

  • creating Malloc backend devices
  • creating Null Block backend devices
  • constructing NVMe-OF subsystems
  • deleting NVMe-OF subsystems

Tests

Test 1: NVMe-OF namespace on a Logival Volumes device

This test configures a SPDK NVMe-OF subsystem backed by logival volume devices and uses FIO to generate I/Os that target those subsystems. The logical volume bdevs are backed by malloc bdevs. Test steps:

  • Step 1: Assign IP addresses to RDMA NICs.
  • Step 2: Start SPDK nvmf_tgt application.
  • Step 3: Create malloc bdevs.
  • Step 4: Create logical volume stores on malloc bdevs.
  • Step 5: Create 10 logical volume bdevs on each logical volume store.
  • Step 6: Create NVMe-OF subsystems with logical volume bdev namespaces.
  • Step 7: Connect to NVMe-OF susbsystems with kernel initiator.
  • Step 8: Run FIO with workload parameters: blocksize=256k, iodepth=64, workload=randwrite; varify flag is enabled so that FIO reads and verifies the data written to the logical device. The run time is 10 seconds for a quick test an 10 minutes for longer nightly test.
  • Step 9: Disconnect kernel initiator from NVMe-OF subsystems.
  • Step 10: Delete NVMe-OF subsystems from configuration.