38 lines
1.6 KiB
Markdown
38 lines
1.6 KiB
Markdown
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# SPDK nvmf_tgt test plan
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## Objective
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The purpose of these tests is to verify correct behavior of SPDK NVMeOF
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feature.
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These tests are run either per-commit or as nightly tests.
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## Configuration
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All tests share the same basic configuration file for SPDK nvmf_tgt to run.
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Static configuration from config file consists of setting number of per session
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queues and enabling RPC for further configuration via RPC calls.
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RPC calls used for dynamic configuration consist:
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- creating Malloc backend devices
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- creating Null Block backend devices
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- constructing NVMe-OF subsystems
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- deleting NVMe-OF subsystems
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### Tests
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#### Test 1: NVMe-OF namespace on a Logival Volumes device
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This test configures a SPDK NVMe-OF subsystem backed by logival volume
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devices and uses FIO to generate I/Os that target those subsystems.
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The logical volume bdevs are backed by malloc bdevs.
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Test steps:
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- Step 1: Assign IP addresses to RDMA NICs.
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- Step 2: Start SPDK nvmf_tgt application.
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- Step 3: Create malloc bdevs.
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- Step 4: Create logical volume stores on malloc bdevs.
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- Step 5: Create 10 logical volume bdevs on each logical volume store.
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- Step 6: Create NVMe-OF subsystems with logical volume bdev namespaces.
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- Step 7: Connect to NVMe-OF susbsystems with kernel initiator.
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- Step 8: Run FIO with workload parameters: blocksize=256k, iodepth=64,
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workload=randwrite; varify flag is enabled so that FIO reads and verifies
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the data written to the logical device. The run time is 10 seconds for a
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quick test an 10 minutes for longer nightly test.
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- Step 9: Disconnect kernel initiator from NVMe-OF subsystems.
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- Step 10: Delete NVMe-OF subsystems from configuration.
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