Seth Howell ce6a7cd8b8 test/bdev/mt free unregistered bdevs after polling. ... This unit test operated under the assumption that one could immediately free a bdev after calling spdk_bdev_unregister. This assumption is broken when we moved the actual destroy call to an asynchronous callback to spdk_io_device_unregister. Change-Id: I92d34f7e2e2993bfe9391f9bb72e08128dec74f4 Signed-off-by: Seth Howell <seth.howell@intel.com> Reviewed-on: https://review.gerrithub.io/406429 Tested-by: SPDK Automated Test System <sys_sgsw@intel.com> Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com> Reviewed-by: Ben Walker <benjamin.walker@intel.com> Reviewed-by: Jim Harris <james.r.harris@intel.com>		2018-04-04 17:05:22 -04:00
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bdev.c	test/unit/bdev: mock out thread for tests.	2018-04-04 17:05:22 -04:00
gpt	test: move test_env.c under test/common/lib	2018-03-29 00:31:24 -04:00
mt	test/bdev/mt free unregistered bdevs after polling.	2018-04-04 17:05:22 -04:00
part.c	test/unit/part: mock out thread for tests.	2018-04-04 17:05:22 -04:00
pmem	bdev/pmem: add conf support to test in blockdev.sh	2018-04-03 14:14:29 -04:00
scsi_nvme.c	test: use spdk.unittest.mk in bdev unit tests	2018-02-14 11:07:05 -05:00
vbdev_lvol.c	lvol: remove num_clusters member from spdk_lvol	2018-03-23 04:02:13 -04:00
Makefile	bdev: move part helper code into its own file	2018-02-27 12:36:26 -05:00