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test/bdev/mt free unregistered bdevs after polling.

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This unit test operated under the assumption that one could immediately
free a bdev after calling spdk_bdev_unregister. This assumption is
broken when we moved the actual destroy call to an asynchronous callback
to spdk_io_device_unregister.

Change-Id: I92d34f7e2e2993bfe9391f9bb72e08128dec74f4
Signed-off-by: Seth Howell <seth.howell@intel.com>
Reviewed-on: https://review.gerrithub.io/406429
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
This commit is contained in:
Seth Howell 2018-04-04 09:23:34 -07:00 committed by Jim Harris
parent ecd5f65138
commit ce6a7cd8b8
1 changed files with 2 additions and 2 deletions
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4
test/unit/lib/bdev/mt/bdev.c/bdev_ut.c
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@ -221,7 +221,6 @@ unregister_bdev(struct ut_bdev *ut_bdev)
/* Handle any deferred messages. */
poll_threads();
spdk_bdev_unregister(&ut_bdev->bdev, NULL, NULL);
memset(ut_bdev, 0, sizeof(*ut_bdev));
}
static void
@ -260,6 +259,7 @@ teardown_test(void)
spdk_io_device_unregister(&g_io_device, NULL);
spdk_bdev_finish(finish_cb, NULL);
poll_threads();
memset(&g_bdev, 0, sizeof(g_bdev));
CU_ASSERT(g_teardown_done == true);
g_teardown_done = false;
free_threads();
@ -1218,8 +1218,8 @@ enomem_multi_bdev(void)
spdk_put_io_channel(second_ch);
spdk_bdev_close(second_desc);
unregister_bdev(second_bdev);
free(second_bdev);
poll_threads();
free(second_bdev);
teardown_test();
}