Spdk/test/unit/lib/util
Shuhei Matsumoto 65624bd5e4 dix: Generate DIF for separate metadata payload
This patch adds APIs to generate and verify DIF for SGL
payload with separate metadata as byte alignment and granularity.

Change-Id: I4e553c9b6f8c96e576a69115002963d32379d439
Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-on: https://review.gerrithub.io/c/434150
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
2019-01-09 19:54:35 +00:00
..
base64.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
bit_array.c util: added bit array bitmask load, store and clear 2018-12-14 15:34:53 +00:00
cpuset.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
crc16.c util/crc16: Add spdk_crc16_t10dif_copy to use in read strip and write insert 2018-12-20 17:52:29 +00:00
crc32_ieee.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
crc32c.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
dif.c dix: Generate DIF for separate metadata payload 2019-01-09 19:54:35 +00:00
string.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
Makefile dif: Generate DIF for extended LBA payload 2018-12-20 17:52:29 +00:00