Spdk/test/unit
Shuhei Matsumoto 65624bd5e4 dix: Generate DIF for separate metadata payload
This patch adds APIs to generate and verify DIF for SGL
payload with separate metadata as byte alignment and granularity.

Change-Id: I4e553c9b6f8c96e576a69115002963d32379d439
Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-on: https://review.gerrithub.io/c/434150
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
2019-01-09 19:54:35 +00:00
..
include build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
lib dix: Generate DIF for separate metadata payload 2019-01-09 19:54:35 +00:00
Makefile test: add histogram unit tests 2017-12-29 14:20:48 -05:00
unittest.sh dif: Generate DIF for extended LBA payload 2018-12-20 17:52:29 +00:00