Ben Walker feb082a24a fio: Remove the trim step from full_bench.fio ... The test already writes to the entire device twice, so the trim step does not actually accomplish anything. Change-Id: Ie761389511196d659358f18f557feb80087628cc Signed-off-by: Ben Walker <benjamin.walker@intel.com> Reviewed-on: https://review.gerrithub.io/393832 Reviewed-by: Jim Harris <james.r.harris@intel.com> Tested-by: SPDK Automated Test System <sys_sgsw@intel.com> Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>		2018-01-09 13:40:59 -05:00
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bdev	build: remove $(ENV_CFLAGS) where not necessary	2018-01-03 12:05:59 -05:00
blob	blob: change spdk_bs_iter_next parameter to spdk_blob *	2017-12-15 12:28:44 -05:00
ioat	astyle: enforce braces around single-line statements	2017-12-11 11:19:32 -05:00
nvme	fio: Remove the trim step from full_bench.fio	2018-01-09 13:40:59 -05:00
Makefile	examples: blobstore hello world	2017-08-11 13:17:11 -04:00