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f0e00ef287
Spdk/test/unit/lib/util
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Shuhei Matsumoto f0e00ef287 dif: Inject bit-flip error for extended LBA payload 
This patch adds APIs to inject bit flip error into any field
of the extended LBA payload.

Change-Id: I3ca601999e55ea6228bb525ac8c0744c7df32398
Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-on: https://review.gerrithub.io/434292
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
2018-12-20 17:52:29 +00:00
..
base64.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
bit_array.c util: added bit array bitmask load, store and clear 2018-12-14 15:34:53 +00:00
cpuset.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
crc16.c util/crc16: Add init_crc parameter as seed value to spdk_crc16_t10dif 2018-12-18 17:28:56 +00:00
crc32_ieee.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
crc32c.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
dif.c dif: Inject bit-flip error for extended LBA payload 2018-12-20 17:52:29 +00:00
string.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
Makefile dif: Generate DIF for extended LBA payload 2018-12-20 17:52:29 +00:00