Spdk/test/lib/nvme/overhead
Jim Harris bc00666271 util: enable dynamic spdk_histogram_data sizing
Currently, each histogram range is hardcoded to
128 buckets (1ULL << 7), resulting in 58 ranges
(64 - 7 + 1) and a total size of 58 * 128 *
sizeof(uint64_t) = 59392 bytes.

To allow for more usage models in cases where this
size is prohibitive, enable the following changes:

1) specify number of buckets per range (in number of bits)
2) specify max datapoint value (in number of bits)

The latter can be useful for cases where datapoints
are never close to requiring all 64 bits - and allows
reducing the number of ranges.  Any data points that
exceed the max will be tallied in the last bucket
in the last range.

Testing shows no performance disadvantage using the
dynamic approach.

Signed-off-by: Jim Harris <james.r.harris@intel.com>
Change-Id: I5979bcdff6209faaa9dee293918ef2a78679bcd4

Reviewed-on: https://review.gerrithub.io/392707
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
2017-12-29 14:20:48 -05:00
..
.gitignore nvme: add gitignore to overhead directory 2016-08-02 14:33:21 -07:00
Makefile build: create a common mk file for nvme library tests and examples 2016-11-22 11:45:47 -07:00
overhead.c util: enable dynamic spdk_histogram_data sizing 2017-12-29 14:20:48 -05:00
README nvme: add new test application to measure SW overhead 2016-08-01 12:58:30 -07:00

This application measures the software overhead of I/O submission
and completion for both the SPDK NVMe driver and an AIO file handle.
It runs a random read, queue depth = 1 workload to a single device,
and captures TSC as follows:

* Submission: capture TSC before and after the I/O submission
  call (SPDK or AIO).
* Completion: capture TSC before and after the I/O completion
  check.  Only record the TSC delta if the I/O completion check
  resulted in a completed I/O.  Also use heuristics in the AIO
  case to account for time spent in interrupt handling outside
  of the actual I/O completion check.

Usage:

To test software overhead for a 4KB I/O over a 10 second period:

SPDK:  overhead -s 4096 -t 10
AIO:   overhead -s 4096 -t 10 /dev/nvme0n1

Note that for the SPDK case, it will only use the first namespace
on the first controller found by SPDK.  If a different namespace is
desired, attach controllers individually to the kernel NVMe driver
to ensure they will not be enumerated by SPDK.