Spdk/test/unit/lib/nvmf/ctrlr_bdev.c
Jim Harris 3e7356580b trace: inline tpoint_mask checking
This reduces overhead of spdk_trace_record calls when
tracing is not enabled.

While here, remove a couple of unit test stubs for
spdk_trace_record that weren't needed anymore.

Signed-off-by: Jim Harris <james.r.harris@intel.com>
Change-Id: I2cbb91e7d3311d95444d663f466d846676d2dcce

Reviewed-on: https://review.gerrithub.io/424276
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
2018-09-04 17:09:25 +00:00
..
.gitignore nvmf: Remove direct mode 2017-08-02 13:57:45 -04:00
ctrlr_bdev_ut.c trace: inline tpoint_mask checking 2018-09-04 17:09:25 +00:00
Makefile test: use spdk.unittest.mk for nvmf unit tests 2018-02-14 10:40:40 -05:00