Spdk/test
Jim Harris a8e1295d4b test/iscsi_tgt: use stub application
The stub application will ensure that each
iSCSI test does not need to reinitialized DPDK
memory and NVMe devices.  This drastically
cuts down on the amount of time needed to run
all of the iscsi_tgt tests.

While here, add a new common ISCSI_TEST_CORE_MASK
shell variable, eliminating a bunch of copies of
the 0xFFFF core mask, and ensuring the stub application
chooses a core mask that overlaps all of the iscsi_tgt
test cases.

Signed-off-by: Jim Harris <james.r.harris@intel.com>
Change-Id: Ifae73276923258ff64370ae42e19cf1a4a2c2212

Reviewed-on: https://review.gerrithub.io/362454
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
2017-05-25 16:55:03 -04:00
..
app app/stub: add a stub application to accelerate startup 2017-05-25 13:52:09 -04:00
blobfs/rocksdb test/blobfs/rocksdb: clean before building 2017-05-02 16:49:50 -07:00
cpp_headers test/cpp_headers: autogenerate header test files 2016-10-03 10:24:18 -07:00
iscsi_tgt test/iscsi_tgt: use stub application 2017-05-25 16:55:03 -04:00
lib examples/nvme/perf: add a latency summary 2017-05-24 23:39:06 -04:00
nvmf bdev: add a null bdev module 2017-05-15 14:00:37 -07:00
vhost vhost: added rpc commands to remove vhost controllers and devices 2017-05-18 01:01:46 -07:00
Makefile app/stub: add a stub application to accelerate startup 2017-05-25 13:52:09 -04:00
spdk_cunit.h include: Move the remainder of the code base to stdinc.h 2017-05-08 13:20:36 -07:00