Spdk/test/common
Michal Berger 4a6cb93072 test/nvme/zns: Add simple fio test for zoned nvme devices
Signed-off-by: Michal Berger <michalx.berger@intel.com>
Change-Id: I2ecad040bcaa573ace5ea2adfb1c0735d8388ce2
Reviewed-on: https://review.spdk.io/gerrit/c/spdk/spdk/+/9182
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Reviewed-by: Tomasz Zawadzki <tomasz.zawadzki@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
2022-06-30 13:32:28 -04:00
..
config spelling: test 2022-06-30 13:32:28 -04:00
lib rdma: Update for memory map 2022-06-30 13:32:28 -04:00
applications.sh test/common: Add SPDK_APP wrapper for spdk_tgt 2021-01-07 13:38:26 +00:00
autotest_common.sh autotest: Skip use of any zoned nvme devices 2022-06-30 13:32:28 -04:00
skipped_build_files.txt lib/util: optimize base64 encode and decode using ARM SVE intrinsics 2021-08-06 07:31:06 +00:00
skipped_tests.txt test/nvme/zns: Add simple fio test for zoned nvme devices 2022-06-30 13:32:28 -04:00