Daniel Verkamp d054c97e65 test/nvme: add overhead to autotest ... Change-Id: Ic52f23c80f8698d361064365336c32b394fd2c98 Signed-off-by: Daniel Verkamp <daniel.verkamp@intel.com>		2016-08-01 16:43:06 -07:00
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aer	nvme: add remove callback to spdk_nvme_probe()	2016-06-28 14:21:58 -07:00
e2edp	nvme: add remove callback to spdk_nvme_probe()	2016-06-28 14:21:58 -07:00
overhead	test: only apply overhead test heuristic for AIO test case	2016-08-01 14:32:08 -07:00
reset	nvme: add remove callback to spdk_nvme_probe()	2016-06-28 14:21:58 -07:00
sgl	nvme: add remove callback to spdk_nvme_probe()	2016-06-28 14:21:58 -07:00
unit	nvme: combine CAP register into one 64-bit union	2016-07-07 13:52:16 -07:00
Makefile	nvme: add new test application to measure SW overhead	2016-08-01 12:58:30 -07:00
nvme.sh	test/nvme: add overhead to autotest	2016-08-01 16:43:06 -07:00