Spdk/test/unit/lib/util
Shuhei Matsumoto e303567bc1 util/crc16: Add init_crc parameter as seed value to spdk_crc16_t10dif
Add init_crc parameter as seed value to spdk_crc16_t10dif API to generate
a CRC value spanning multiple separate buffers.

This will be necessary for upcoming DIF/DIX patches.

Having init_crc parameter is general, and so change the existing API
without adding seed version of the existing API.

Change-Id: I0ac7919b18013967e41829dcedd3e4e73204d5d6
Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-on: https://review.gerrithub.io/437204
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
2018-12-18 17:28:56 +00:00
..
base64.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
bit_array.c util: added bit array bitmask load, store and clear 2018-12-14 15:34:53 +00:00
cpuset.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
crc16.c util/crc16: Add init_crc parameter as seed value to spdk_crc16_t10dif 2018-12-18 17:28:56 +00:00
crc32_ieee.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
crc32c.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
string.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
Makefile util/base64: add base64 lib and unit tests 2018-07-19 00:50:54 +00:00