Michal Berger c0fb1b93d0 test/unit: [nvmf/ctrlr.c] Increase feature get|set coverage ... Add tests for the following features: - SPDK_NVME_FEAT_TEMPERATURE_THRESHOLD (4), - SPDK_NVME_FEAT_ERROR_RECOVERY (5), For Temperature Threshold feature the validity of the THSEL and TMPSEL is covered as described in the NVMe spec (1.4): "Figure 279: Temperature Threshold – Command Dword 11" For the Error Recovery feature the validity of the DULBE is covered as decribed in the NVME spec (1.4): "Figure 280: Error Recovery – Command Dword 11" Random value is selected for the lsb in the cdw11 (0x42). Change-Id: Ia57ab4d79439ec315ddc9bbfdad8400aa926062a Signed-off-by: Michal Berger <michalx.berger@intel.com> Reviewed-on: https://review.spdk.io/gerrit/c/spdk/spdk/+/692 Tested-by: SPDK CI Jenkins <sys_sgci@intel.com> Reviewed-by: Darek Stojaczyk <dariusz.stojaczyk@intel.com> Reviewed-by: Jim Harris <james.r.harris@intel.com>		2020-02-27 10:15:40 +00:00
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include	test/unit: remove duplicate mk/spdk.common.mk includes	2019-02-11 09:30:27 +00:00
lib	test/unit: [nvmf/ctrlr.c] Increase feature get|set coverage	2020-02-27 10:15:40 +00:00
Makefile	test: add histogram unit tests	2017-12-29 14:20:48 -05:00
unittest.sh	ut/raid: put bdev_raid.c into 'raid' subdirectory	2020-02-20 14:40:19 +00:00