Spdk/test/unit
Dariusz Stojaczyk bfb73837de ut/bdev_mt: add test case for ENOMEM handling with multiple io targets
Bdev layer has been recently refactored to share
internal module channels for *all* bdevs of the
same bdev module. This makes us return ENOMEM for I/O
of one bdev if another bdev of the same module (nvme, split, etc)
is entirely saturated. This is not the behavior we want,
as these bdevs may not have anything in common.

This `issue` has been fixed just now, but to prevent
it coming back again lets add a unit test for it.

This test case creates two bdevs using two separate
io_devices and checks if ENOMEM handling is somehow common
for these two. It must not be.

Change-Id: Ic32ef4b4347b8856d4b9f91107e6f188ad67978e
Suggested-by: Ben Walker <benjamin.walker@intel.com>
Signed-off-by: Dariusz Stojaczyk <dariuszx.stojaczyk@intel.com>
Reviewed-on: https://review.gerrithub.io/409997
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
2018-05-09 18:19:06 +00:00
..
include test: use spdk.unittest.mk for histogram_data.h unit tests 2018-02-14 11:07:05 -05:00
lib ut/bdev_mt: add test case for ENOMEM handling with multiple io targets 2018-05-09 18:19:06 +00:00
Makefile test: add histogram unit tests 2017-12-29 14:20:48 -05:00
unittest.sh bdev/pmem: change all NVML strings to PMDK 2018-04-07 00:07:57 -04:00