Spdk/test/lib/nvme/overhead
Jim Harris 5dff1923b6 test/nvme: use stub to accelerate test time
For now, just hardcode the shm_id to 0 for any test apps
that currently do not support command-line arguments.

Signed-off-by: Jim Harris <james.r.harris@intel.com>
Change-Id: Ic8de44d4badc4c9b8858596b7f55dcc04371371b

Reviewed-on: https://review.gerrithub.io/365732
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
2017-06-16 15:27:13 -04:00
..
.gitignore nvme: add gitignore to overhead directory 2016-08-02 14:33:21 -07:00
Makefile build: create a common mk file for nvme library tests and examples 2016-11-22 11:45:47 -07:00
overhead.c test/nvme: use stub to accelerate test time 2017-06-16 15:27:13 -04:00
README nvme: add new test application to measure SW overhead 2016-08-01 12:58:30 -07:00

This application measures the software overhead of I/O submission
and completion for both the SPDK NVMe driver and an AIO file handle.
It runs a random read, queue depth = 1 workload to a single device,
and captures TSC as follows:

* Submission: capture TSC before and after the I/O submission
  call (SPDK or AIO).
* Completion: capture TSC before and after the I/O completion
  check.  Only record the TSC delta if the I/O completion check
  resulted in a completed I/O.  Also use heuristics in the AIO
  case to account for time spent in interrupt handling outside
  of the actual I/O completion check.

Usage:

To test software overhead for a 4KB I/O over a 10 second period:

SPDK:  overhead -s 4096 -t 10
AIO:   overhead -s 4096 -t 10 /dev/nvme0n1

Note that for the SPDK case, it will only use the first namespace
on the first controller found by SPDK.  If a different namespace is
desired, attach controllers individually to the kernel NVMe driver
to ensure they will not be enumerated by SPDK.