Shuhei Matsumoto 3c7894ffff ut/bdev: Prepare test code for submitting batched split I/Os ... Current test code works only for sequential split I/Os. The next patch will support submitting batchedsplit I/Os. Prepare test code as a separate patch to make review easier. Change-Id: I05b732c9a656ecab74a2594bf50ddf42eb41584e Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com> Reviewed-on: https://review.gerrithub.io/425877 Tested-by: SPDK CI Jenkins <sys_sgci@intel.com> Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com> Reviewed-by: Paul Luse <paul.e.luse@intel.com> Reviewed-by: Jim Harris <james.r.harris@intel.com> Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>		2018-09-29 03:12:24 +00:00
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include	test: use spdk.unittest.mk for histogram_data.h unit tests	2018-02-14 11:07:05 -05:00
lib	ut/bdev: Prepare test code for submitting batched split I/Os	2018-09-29 03:12:24 +00:00
Makefile	test: add histogram unit tests	2017-12-29 14:20:48 -05:00
unittest.sh	bdev: Add crypto virtual bdev module	2018-09-17 21:23:14 +00:00