Shuhei Matsumoto 2fefd9f53c ut/dif: Fill test data buffer by cyclic values to find potential issues ... Previously, test data buffer was filled by one value, 0xAB, but this may not be enough to detect future potential issues. ut_data_pattern_verify() already did per-byte check, but size of test data buffer is small and completion time of tests is not long. So, even if we change ut_data_pattern_generate() to set per-byte data instead of memset(), extra overhead of test completion time will be negligible. Change-Id: I35677b238f96a73c0c408f0818f080a92492dac6 Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com> Reviewed-on: https://review.gerrithub.io/c/445430 Tested-by: SPDK CI Jenkins <sys_sgci@intel.com> Reviewed-by: Jim Harris <james.r.harris@intel.com> Reviewed-by: Ben Walker <benjamin.walker@intel.com> Reviewed-by: wuzhouhui <wuzhouhui@kingsoft.com>		2019-02-22 17:52:51 +00:00
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.gitignore	dif: Generate DIF for extended LBA payload	2018-12-20 17:52:29 +00:00
dif_ut.c	ut/dif: Fill test data buffer by cyclic values to find potential issues	2019-02-22 17:52:51 +00:00
Makefile	test/unit: remove duplicate mk/spdk.common.mk includes	2019-02-11 09:30:27 +00:00