Shuhei Matsumoto 8c5c2c56b9 ut/bdev_raid: Remove raid_bdev_send_passthru dependent test ... Cleverly, UT for raid bdev sets number of base bdevs by using the random number generator. When the random number generator outputs 1, test code especially for single base bdev case failed. When removing raid_bdev_send_passthru from library, the corresponding test code was not removed. This patch removes the test code. Change-Id: I23be88358fe364bc757979a26398b80339e19910 Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com> Reviewed-on: https://review.gerrithub.io/424159 Tested-by: SPDK CI Jenkins <sys_sgci@intel.com> Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com> Reviewed-by: Kunal Sablok <kunal.sablok@intel.com> Reviewed-by: Jim Harris <james.r.harris@intel.com> Reviewed-by: Ben Walker <benjamin.walker@intel.com>		2018-09-11 19:00:05 +00:00
..
bdev_raid.c	ut/bdev_raid: Remove raid_bdev_send_passthru dependent test	2018-09-11 19:00:05 +00:00
bdev.c	trace: remove alias concept	2018-09-05 18:03:43 +00:00
gpt	test: fix typos in the test directory	2018-08-27 19:39:31 +00:00
mt	test/bdev: Add a unit test to expose a race condition	2018-09-07 16:04:47 +00:00
part.c	trace: remove alias concept	2018-09-05 18:03:43 +00:00
pmem	test/unit: fix scan-build error in pmem ut	2018-09-05 17:21:03 +00:00
scsi_nvme.c	bdev: move error union to internal spdk_bdev_io struct	2018-06-26 20:04:07 +00:00
vbdev_lvol.c	test/unit: Fix scan-build errors in bdev unittests	2018-08-31 00:01:09 +00:00
Makefile	bdev: add raid bdev module	2018-07-16 20:50:40 +00:00