Spdk/test
Dariusz Stojaczyk 73358c99e1 util/nvme: added io_device unregister callback
Patch afe860ae deferred freeing the io_device. However, for nvme, the
io_device context (spdk_nvme_ctrlr) is still being destructed before
io_channels are destroyed, causing segfaults on hotremove.

This patch defers io_device context destruction and fixes nvme
hotremove.

Fixes: afe860aeb1 ("channel: Correctly defer unregisters if channels exist")
Fixes: 5533c3d208 ("util: defer put_io_channel")

Change-Id: I7af699174cac0c6c6a6faa2cc65418c47347eb9a
Signed-off-by: Dariusz Stojaczyk <dariuszx.stojaczyk@intel.com>
Reviewed-on: https://review.gerrithub.io/370459
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
2017-07-20 16:07:02 -04:00
..
app test/app/stub: remove sentinel file on shutdown 2017-06-23 11:02:04 -04:00
blobfs/rocksdb Revert "test/blobfs: use test stub" 2017-06-27 13:52:15 -04:00
cpp_headers test/cpp_headers: autogenerate header test files 2016-10-03 10:24:18 -07:00
iscsi_tgt test/iscsi: remove gen_nvme from FIO test 2017-07-14 19:35:44 -04:00
lib nbd: fix bdev alignment issue 2017-07-19 13:54:38 -04:00
nvmf log: Remove configurable log facility 2017-07-05 19:28:29 -04:00
unit util/nvme: added io_device unregister callback 2017-07-20 16:07:02 -04:00
vhost vhost_scsi: implemented abstract vhost event layer 2017-07-20 13:19:26 -04:00
Makefile test: begin moving unit tests into test/unit 2017-06-16 16:43:48 -04:00
spdk_cunit.h include: Move the remainder of the code base to stdinc.h 2017-05-08 13:20:36 -07:00