Spdk/test/unit/lib/util
Shuhei Matsumoto ed45352564 dix: Return DIF error information at verification for separate metadata payload
For separate metadata payload, Introduce a struct to collect DIF error
information and pass the reference to the struct to bit-flip error injection
and verification.

This change will make logging of DIF error and comparison between
injection and verification possible for separate metadata payload.

Merging this patch to the previous is possible but add this as a separate patch
to reduce the patch size.

Change-Id: Ifce2130e902bc090cbe205fa8df12559739ced57
Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-on: https://review.gerrithub.io/c/435097
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
2019-01-09 19:54:35 +00:00
..
base64.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
bit_array.c util: added bit array bitmask load, store and clear 2018-12-14 15:34:53 +00:00
cpuset.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
crc16.c util/crc16: Add spdk_crc16_t10dif_copy to use in read strip and write insert 2018-12-20 17:52:29 +00:00
crc32_ieee.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
crc32c.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
dif.c dix: Return DIF error information at verification for separate metadata payload 2019-01-09 19:54:35 +00:00
string.c build: remove duplicate spdk.app.mk includes 2018-12-11 18:07:53 +00:00
Makefile dif: Generate DIF for extended LBA payload 2018-12-20 17:52:29 +00:00