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Spdk/test/iscsi_tgt
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Ziye Yang 7d101fe6c6 blockdev, nvme: Test parsing device exported by NVMe-oF in conf 
Change-Id: I9fbb1dc5a487323af099d08ab466fc811f7be79e
Signed-off-by: Ziye Yang <optimistyzy@gmail.com>
Reviewed-on: https://review.gerrithub.io/366703
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
2017-07-07 13:23:24 -04:00
..
calsoft log: Remove configurable log facility 2017-07-05 19:28:29 -04:00
ext4test bdev/error: Add support of "reset" for error injection bdev module. 2017-07-06 15:02:06 -04:00
filesystem log: Remove configurable log facility 2017-07-05 19:28:29 -04:00
fio log: Remove configurable log facility 2017-07-05 19:28:29 -04:00
idle_migration log: Remove configurable log facility 2017-07-05 19:28:29 -04:00
ip_migration log: Remove configurable log facility 2017-07-05 19:28:29 -04:00
nvme_remote blockdev, nvme: Test parsing device exported by NVMe-oF in conf 2017-07-07 13:23:24 -04:00
rbd log: Remove configurable log facility 2017-07-05 19:28:29 -04:00
reset log: Remove configurable log facility 2017-07-05 19:28:29 -04:00
rpc_config log: Remove configurable log facility 2017-07-05 19:28:29 -04:00
common.sh test/iscsi_tgt: use stub application 2017-05-25 16:55:03 -04:00
iscsi_tgt.sh blockdev, nvme: Test parsing device exported by NVMe-oF in conf 2017-07-07 13:23:24 -04:00