50ff9de715
The NVMe AER test tries to submit a large number of Get Features commands during the test cycle to ensure that admin queue wraparound works and other commands can be issued while still handling AERs correctly. However, it tried to do this by submitting all of the Get Features commands up front, which runs out of admin queue nvme_request objects. Change the test to submit one Get Features command per device and resubmit it as it completes until the test is over. This exercises the queue wraparound case without submitting a large number of requests at once, and it also simplifies the test code. Change-Id: I7cf865b6a8d821f62bba3d889cd21fc929a4d484 Signed-off-by: Daniel Verkamp <daniel.verkamp@intel.com> Reviewed-on: https://review.gerrithub.io/366149 Tested-by: SPDK Automated Test System <sys_sgsw@intel.com> Reviewed-by: Ben Walker <benjamin.walker@intel.com> Reviewed-by: Jim Harris <james.r.harris@intel.com> Reviewed-by: Ziye Yang <optimistyzy@gmail.com> |
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