Spdk/test/lib
Daniel Verkamp c0cf813e11 test/nvme: disable AER in nightly tests
Currently, the nightly tests are hanging due to the AER test program,
which waits for a temperature threshold event to occur.  The QEMU
emulated NVMe controller (as well as the SPDK NVMe-oF target virtual
controller) don't emulate this condition, so the test never finishes.

Change-Id: I41a216f77ffbb3beaef2fdf7533fe62c36033fc6
Signed-off-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-on: https://review.gerrithub.io/389908
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
2017-12-01 17:00:54 -05:00
..
bdev test/bdev: handle the error case the IO channel is not setup 2017-12-01 15:13:51 -05:00
blobfs event: Move spdk_poller_register to io_channel 2017-11-28 12:30:37 -05:00
env build: include spdk.app.mk in all app Makefiles 2017-11-15 17:57:07 -05:00
event event: Move spdk_poller_register to io_channel 2017-11-28 12:30:37 -05:00
ioat test: move IOAT library unit test to test/unit 2017-06-21 18:57:35 -04:00
json test: move JSON library unit tests to test/unit 2017-06-20 13:46:07 -04:00
nvme test/nvme: disable AER in nightly tests 2017-12-01 17:00:54 -05:00
Makefile test: move iSCSI unit tests to test/unit 2017-06-28 13:10:27 -04:00
test_env.c nvme: normalize PCI addresses before comparing 2017-11-16 18:17:09 -05:00
ut_multithread.c event: Move spdk_poller_register to io_channel 2017-11-28 12:30:37 -05:00