Spdk/test/unit
Evgeniy Kochetov 23975858e5 ut/bdev: Add tests for device close and unregister
Signed-off-by: Evgeniy Kochetov <evgeniik@mellanox.com>
Signed-off-by: Sasha Kotchubievsky <sashakot@mellanox.com>
Signed-off-by: Alexey Marchuk <alexeymar@mellanox.com>
Change-Id: Ia2615a00785c60e10fb893e75dd68198fbf84ff3
Reviewed-on: https://review.gerrithub.io/c/spdk/spdk/+/469619
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Reviewed-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
2019-10-01 22:38:48 +00:00
..
include test/unit: remove duplicate mk/spdk.common.mk includes 2019-02-11 09:30:27 +00:00
lib ut/bdev: Add tests for device close and unregister 2019-10-01 22:38:48 +00:00
Makefile test: add histogram unit tests 2017-12-29 14:20:48 -05:00
unittest.sh NVMe-oF Target: Add FC transport. 2019-07-26 22:17:17 +00:00