Spdk/test
Daniel Verkamp 0b3bd6a9c5 nvme/overhead: track min and max submit/complete
Add slightly better statistics to get a range of values instead of just
the average.

Change-Id: I159994dce38412755afdd8980030c407125957e9
Signed-off-by: Daniel Verkamp <daniel.verkamp@intel.com>
2016-08-17 09:32:37 -07:00
..
iscsi_tgt test/iscsi: shorten FIO tests 2016-08-04 16:48:35 -07:00
lib nvme/overhead: track min and max submit/complete 2016-08-17 09:32:37 -07:00
nvmf autotest: move NVMe device cleanup to startup 2016-08-17 09:04:16 -07:00
Makefile build: wrap $(CURDIR) relative paths in $(abspath) 2016-05-09 13:56:07 -07:00
spdk_cunit.h cunit: add test result JSON formatting 2016-05-12 15:42:09 -07:00