Spdk/test/unit
Shuhei Matsumoto 2fefd9f53c ut/dif: Fill test data buffer by cyclic values to find potential issues
Previously, test data buffer was filled by one value, 0xAB, but
this may not be enough to detect future potential issues.

ut_data_pattern_verify() already did per-byte check, but size of
test data buffer is small and completion time of tests is not long.
So, even if we change ut_data_pattern_generate() to set per-byte
data instead of memset(), extra overhead of test completion time
will be negligible.

Change-Id: I35677b238f96a73c0c408f0818f080a92492dac6
Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-on: https://review.gerrithub.io/c/445430
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: wuzhouhui <wuzhouhui@kingsoft.com>
2019-02-22 17:52:51 +00:00
..
include test/unit: remove duplicate mk/spdk.common.mk includes 2019-02-11 09:30:27 +00:00
lib ut/dif: Fill test data buffer by cyclic values to find potential issues 2019-02-22 17:52:51 +00:00
Makefile test: add histogram unit tests 2017-12-29 14:20:48 -05:00
unittest.sh UT: Fix valgrind failure in SPDK UT on arm64 system 2019-02-22 17:50:57 +00:00