Commit Graph

6 Commits

Author SHA1 Message Date
Jim Harris
63b3b8fd8f test/unit: remove duplicate mk/spdk.common.mk includes
mk/spdk.unittest.mk already includes mk/spdk.common.mk, so it's
not needed.  This also fixes an issue where touching an included
.mk file would not trigger unit tests to rebuild if they had
this duplicated mk/spdk.common.mk include.

Signed-off-by: Jim Harris <james.r.harris@intel.com>
Change-Id: I41a04eb77ce468849cb9b53bd1f76df6fec06e46

Reviewed-on: https://review.gerrithub.io/c/443980
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Reviewed-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-by: Darek Stojaczyk <dariusz.stojaczyk@intel.com>
2019-02-11 09:30:27 +00:00
Shuhei Matsumoto
3947bc2492 util/crc16: Add spdk_crc16_t10dif_copy to use in read strip and write insert
For DIF and DIX, read strip and write insert operation will copy
data together with DIF generation and verification.

This patch adds spdk_crc16_t10dif_copy for those cases.

Change-Id: I9a77fa8b367486fe0b6704d58dcdf95d5210c875
Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-on: https://review.gerrithub.io/437461
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
2018-12-20 17:52:29 +00:00
Shuhei Matsumoto
e303567bc1 util/crc16: Add init_crc parameter as seed value to spdk_crc16_t10dif
Add init_crc parameter as seed value to spdk_crc16_t10dif API to generate
a CRC value spanning multiple separate buffers.

This will be necessary for upcoming DIF/DIX patches.

Having init_crc parameter is general, and so change the existing API
without adding seed version of the existing API.

Change-Id: I0ac7919b18013967e41829dcedd3e4e73204d5d6
Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-on: https://review.gerrithub.io/437204
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
2018-12-18 17:28:56 +00:00
Jim Harris
9c2aea2ad5 build: remove duplicate spdk.app.mk includes
spdk.unittest.mk includes spdk.app.mk, but some unit test
Makefiles include both spdk.unittest.mk and spdk.app.mk,
meaning spdk.app.mk gets included twice.  Fix that.

This hasn't been an issue because spdk.app.mk currently
only includes variables - but no rules.

Signed-off-by: Jim Harris <james.r.harris@intel.com>
Change-Id: I23d39e8084f79442fb06ae9b5a6a68d6134adff4

Reviewed-on: https://review.gerrithub.io/434281
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
2018-12-11 18:07:53 +00:00
Jim Harris
7ffe586a17 test: use spdk_unittest.mk for lib/unit unit tests
Signed-off-by: Jim Harris <james.r.harris@intel.com>
Change-Id: I0ae2294e69262ce0dfc9810815ced2ae16d768b9

Reviewed-on: https://review.gerrithub.io/399760
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
2018-02-14 11:07:05 -05:00
Changpeng Liu
9ca670ac8a util/crc16: add crc16 library support and unit tests
Change-Id: I7174f1799361b8337ff5590b90ad6a0564ca8e9b
Signed-off-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-on: https://review.gerrithub.io/391899
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
2017-12-20 15:12:26 -05:00