Commit Graph

4 Commits

Author SHA1 Message Date
Daniel Verkamp
5d0b4b270e test/nvmf: remove nvmf_tgt+pmem test
This has been replaced with a pmem component-level test.

Change-Id: I3c433d9edbb4c4f0ff26d7716cd11ee9df5c0ad7
Signed-off-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-on: https://review.gerrithub.io/405910
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Reviewed-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-by: Karol Latecki <karol.latecki@intel.com>
2018-04-03 14:14:29 -04:00
lgalkax
e6c4c8a15c test/nvmf: Add test scripts with FIO traffic and NVML backend
Add test script to use SPDK Nvmf with NVML backends and run FIO read/write
traffic with verify flag enabled.

Change-Id: Iff8a85f65c36cb7372963076252577b7a1b2378f
Signed-off-by: lgalkax <lukaszx.galka@intel.com>
Signed-off-by: Karol Latecki <karol.latecki@intel.com>
Reviewed-on: https://review.gerrithub.io/379247
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
2017-10-23 11:54:57 -04:00
Daniel Verkamp
61b4258c56 test/nvmf: extend test plan for NVMe-oF target
Change-Id: Ifa6d8cc512942d35aecffd29f5b7e2a85f69f431
Signed-off-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-on: https://review.gerrithub.io/365065
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Reviewed-by: Paul Luse <paul.e.luse@intel.com>
2017-10-10 16:27:58 -04:00
Karol Latecki
564524a7dd test/nvmf: Add nvmf with lvol integrity test
Test for veryfing correct interoperability of nvmf with
use of lvol store / lvol bdev backends.

Also added initial test plan in which test is described.

Change-Id: Ided093091847dff2bca76063926798d5606d73bd
Signed-off-by: Karol Latecki <karol.latecki@intel.com>
Reviewed-on: https://review.gerrithub.io/377529
Reviewed-by: Tomasz Zawadzki <tomasz.zawadzki@intel.com>
Reviewed-by: Maciej Szwed <maciej.szwed@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
2017-09-20 14:21:45 -04:00