The stub application will ensure that each
nvmf test does not need to reinitialized DPDK
memory and NVMe devices. This drastically
cuts down on the amount of time needed to run
all of the nvmf tests.
Change-Id: I6abad4e1298111884f18026e72e36f5d8b73c4b9
Signed-off-by: cunyinch <cunyin.chang@intel.com>
Reviewed-on: https://review.gerrithub.io/362810
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Also adds the automation test case for using remote
NVMe devices exported by NVMe-oF target.
Change-Id: I2b839a4eeec33d5b0c30d654e6013ad8c7949e23
Signed-off-by: Ziye Yang <ziye.yang@intel.com>
