Most of the work here revolves around having to split
an I/O that spans a cluster boundary. In this case
we need to allocate a separate iov array, and then
issue each sub-I/O serially, copying the relevant
subset of the original iov array.
Signed-off-by: Jim Harris <james.r.harris@intel.com>
Change-Id: I0d46b3f832245900d109ee6c78cc6d49cf96428b
Reviewed-on: https://review.gerrithub.io/374880
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
This patch doesn't use it yet but sets up the ability to so that
upcoming unit test pathces can. The next patch will include use
of wrap in one nvme UT and then following that the wrap and
today's use of globally controlled stubs will be morphed into a
simple mock type capability for spdk unit tests.
Change-Id: I252160266f0b5c76e50fd213cb3e1686d48b9d0e
Signed-off-by: Paul Luse <paul.e.luse@intel.com>
Reviewed-on: https://review.gerrithub.io/363441
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
