The stub application will ensure that each
nvmf test does not need to reinitialized DPDK
memory and NVMe devices. This drastically
cuts down on the amount of time needed to run
all of the nvmf tests.
Change-Id: I6abad4e1298111884f18026e72e36f5d8b73c4b9
Signed-off-by: cunyinch <cunyin.chang@intel.com>
Reviewed-on: https://review.gerrithub.io/362810
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
The setup.sh parameters we use in autotest don't allow for enough RAM
for 12 subsystems; reduce it slightly while still testing a large
number.
Change-Id: I595589db6e5199ad87ad9511bb0ad63b7b60211d
Signed-off-by: Daniel Verkamp <daniel.verkamp@intel.com>
It is caused by this commit:
4163626c5c
nvmf_tgt_delete_subsystem registers the poller
with function subsystem_delete_event.
subsystem_delete_event is called asynchronously,
the deletion should happen in this function.
Otherwise, with the current code,
g_subsystems_shutdown = true
TAILQ_EMPTY(&g_subsystems) = true
when subsystem_delete_event is firstly called.
If there are multiple subsystems, the logic is wrong.
Thus other subsystem will never be delete. since
we already execute shutdown_complete().
Also add related test scripts.
Change-Id: I3823563fc9e8611c11a6d798685ff64e2939842e
Signed-off-by: Ziye Yang <ziye.yang@intel.com>
