Both clean and dirty shutdown tests were expanded to perform additional
writes after restore, to make sure write pointers have been correctly
re-initialised and don't cause data corruption.
Signed-off-by: Mateusz Kozlowski <mateusz.kozlowski@intel.com>
Change-Id: I662cf196319a39fb1cab455f5a76571904c20215
Reviewed-on: https://review.gerrithub.io/c/spdk/spdk/+/457618
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Konrad Sztyber <konrad.sztyber@intel.com>
Reviewed-by: Wojciech Malikowski <wojciech.malikowski@intel.com>
Reviewed-by: Darek Stojaczyk <dariusz.stojaczyk@intel.com>
It's always set in autotest_common.sh, there's no need
to set it again in each test script.
Change-Id: Ib14c4189c553dad54a3065c1a1d413a5fc5a5347
Signed-off-by: Darek Stojaczyk <dariusz.stojaczyk@intel.com>
Reviewed-on: https://review.gerrithub.io/c/spdk/spdk/+/457466
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
This patch introduces functional tests for FTL bdev.
The tests cover various I/O workflows and check data integrity. Several
scripts have been added to test the FTL library:
* generate_config.sh - prepares configuration scripts for specified
device
* restore.sh - tests restoring device's state from the SSD
* fio.sh - runs tests based on fio and fio_plugin
The tests are run from autotest.sh when the SPDK_TEST_BDEV_FTL flag is
set.
Change-Id: I561d99ed35fe91eadd3756789cc99afe2da8c1db
Signed-off-by: Mateusz Kozlowski <mateusz.kozlowski@intel.com>
Signed-off-by: Wojciech Malikowski <wojciech.malikowski@intel.com>
Signed-off-by: Konrad Sztyber <konrad.sztyber@intel.com>
Reviewed-on: https://review.gerrithub.io/c/431330
Reviewed-by: Darek Stojaczyk <dariusz.stojaczyk@intel.com>
Reviewed-by: Tomasz Zawadzki <tomasz.zawadzki@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
