Commit Graph

2 Commits

Author SHA1 Message Date
Shuhei Matsumoto
f0e00ef287 dif: Inject bit-flip error for extended LBA payload
This patch adds APIs to inject bit flip error into any field
of the extended LBA payload.

Change-Id: I3ca601999e55ea6228bb525ac8c0744c7df32398
Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-on: https://review.gerrithub.io/434292
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
2018-12-20 17:52:29 +00:00
Shuhei Matsumoto
8b6c22b1a0 dif: Generate DIF for extended LBA payload
DIF and DIX will be supported in SPDK throughout, e.g., NVMe
driver, NVMe-oF initiator and target, NVMe block device, malloc
block device, SCSI, iSCSI target, FIO plugin, and Perf.

Generic and common APIs to generate and verify DIF and inject
bit flip error to any field will be helpful for them.

This patch is the first in the patch series.

This patch adds APIs to generate and verify DIF for SGL extended
LBA payload as byte alignement and granularity.

Change-Id: Ie6588d960113761f10efbf2d2a3cae004af37ce8
Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-on: https://review.gerrithub.io/432261
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
2018-12-20 17:52:29 +00:00