This patch adds two new unit tests for scsi device:
- creating two different devices, each containing the same lun
- creating one device, with the same lun twice
As noted in code, three asserts are incorrectly set to show functionality
that is not working currently.
Next patch in series implements that functionality and changes asserts
in the unit tests.
Signed-off-by: Tomasz Zawadzki <tomasz.zawadzki@intel.com>
Change-Id: I2645401fee4f2cd986458e0a4db108ce4e1bf9db
Combine the necessary functionality with the main bdev file.
Change-Id: I96d796bc87ac2a8688cdf1fd3c16d2a7c8aef730
Signed-off-by: Ben Walker <benjamin.walker@intel.com>
