mk/spdk.unittest.mk already includes mk/spdk.common.mk, so it's
not needed. This also fixes an issue where touching an included
.mk file would not trigger unit tests to rebuild if they had
this duplicated mk/spdk.common.mk include.
Signed-off-by: Jim Harris <james.r.harris@intel.com>
Change-Id: I41a04eb77ce468849cb9b53bd1f76df6fec06e46
Reviewed-on: https://review.gerrithub.io/c/443980
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Reviewed-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-by: Darek Stojaczyk <dariusz.stojaczyk@intel.com>
DIF and DIX will be supported in SPDK throughout, e.g., NVMe
driver, NVMe-oF initiator and target, NVMe block device, malloc
block device, SCSI, iSCSI target, FIO plugin, and Perf.
Generic and common APIs to generate and verify DIF and inject
bit flip error to any field will be helpful for them.
This patch is the first in the patch series.
This patch adds APIs to generate and verify DIF for SGL extended
LBA payload as byte alignement and granularity.
Change-Id: Ie6588d960113761f10efbf2d2a3cae004af37ce8
Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-on: https://review.gerrithub.io/432261
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
