The stub application will ensure that each
nvmf test does not need to reinitialized DPDK
memory and NVMe devices. This drastically
cuts down on the amount of time needed to run
all of the nvmf tests.
Change-Id: I6abad4e1298111884f18026e72e36f5d8b73c4b9
Signed-off-by: cunyinch <cunyin.chang@intel.com>
Reviewed-on: https://review.gerrithub.io/362810
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
This patch creates a new test case: use rpc to
frequently add/delete a same subsystem to verify the
correctness of our code.
Change-Id: Ib582061f9fa909f271bea4865df29a3f432f807c
Signed-off-by: Ziye Yang <ziye.yang@intel.com>
