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3 Commits

Author SHA1 Message Date
Daniel Verkamp
0b3bd6a9c5 nvme/overhead: track min and max submit/complete 
Add slightly better statistics to get a range of values instead of just
the average.

Change-Id: I159994dce38412755afdd8980030c407125957e9
Signed-off-by: Daniel Verkamp <daniel.verkamp@intel.com>
 2016-08-17 09:32:37 -07:00
Jim Harris
766da93b27 test: only apply overhead test heuristic for AIO test case 
Signed-off-by: Jim Harris <james.r.harris@intel.com>
Change-Id: I29ee2575ba13724baad4caac72b35c57b92347ac
 2016-08-01 14:32:08 -07:00
Jim Harris
da214ab254 nvme: add new test application to measure SW overhead 
Signed-off-by: Jim Harris <james.r.harris@intel.com>
Change-Id: I330ca1577e5725b0e135422156328d5b165e79a3
 2016-08-01 12:58:30 -07:00