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test: update multi-process Async Event Report test

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Updated the existing nvme aer test to only print information
about AEN one time per controller. If the SSD is slow to
reset the temperature setting, it could continually generate
AENs and spam the output logs.

Fixes: #2660.
Fixes: #2662.
Fixes: #2664.

Signed-off-by: Curt Bruns <curt.e.bruns@gmail.com>
Change-Id: Ibbaa9c54bd5f27a018d85ad53390933628975883
Reviewed-on: https://review.spdk.io/gerrit/c/spdk/spdk/+/14239
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Reviewed-by: Dong Yi <dongx.yi@intel.com>
This commit is contained in:
Curt Bruns 2022-08-26 10:36:48 -07:00 committed by Tomasz Zawadzki
parent ffa823557a
commit b668e6d853
1 changed files with 14 additions and 2 deletions
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16
test/nvme/aer/aer.c
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@ -18,6 +18,7 @@ struct dev {
bool ns_test_active; bool ns_test_active;
struct spdk_nvme_health_information_page *health_page; struct spdk_nvme_health_information_page *health_page;
uint32_t orig_temp_threshold; uint32_t orig_temp_threshold;
bool reset_temp_active;
char name[SPDK_NVMF_TRADDR_MAX_LEN + 1]; char name[SPDK_NVMF_TRADDR_MAX_LEN + 1];
}; };
@ -211,6 +212,11 @@ aer_cb(void *arg, const struct spdk_nvme_cpl *cpl)
return; return;
} }
/* If we are already resetting the temp, no need to print more AENs */
if (dev->reset_temp_active) {
return;
}
AER_PRINTF("%s: aer_cb for log page %d, aen_event_type: 0x%02x, aen_event_info: 0x%02x\n", AER_PRINTF("%s: aer_cb for log page %d, aen_event_type: 0x%02x, aen_event_info: 0x%02x\n",
dev->name, log_page_id, aen_event_type, aen_event_info); dev->name, log_page_id, aen_event_type, aen_event_info);
/* Temp Test: Verify proper EventType, Event Info and Log Page. /* Temp Test: Verify proper EventType, Event Info and Log Page.
@ -225,7 +231,10 @@ aer_cb(void *arg, const struct spdk_nvme_cpl *cpl)
/* Set the temperature threshold back to the original value to stop triggering */ /* Set the temperature threshold back to the original value to stop triggering */
if (g_parent_process) { if (g_parent_process) {
AER_PRINTF("aer_cb - Resetting Temp Threshold for device: %s\n", dev->name); AER_PRINTF("aer_cb - Resetting Temp Threshold for device: %s\n", dev->name);
set_temp_threshold(dev, dev->orig_temp_threshold); if (set_temp_threshold(dev, dev->orig_temp_threshold)) {
g_failed = 1;
}
dev->reset_temp_active = true;
} }
get_health_log_page(dev); get_health_log_page(dev);
} else if (log_page_id == SPDK_NVME_LOG_CHANGED_NS_LIST) { } else if (log_page_id == SPDK_NVME_LOG_CHANGED_NS_LIST) {
@ -413,6 +422,7 @@ spdk_aer_temperature_test(void)
foreach_dev(dev) { foreach_dev(dev) {
/* Get the original temperature threshold */ /* Get the original temperature threshold */
get_temp_threshold(dev); get_temp_threshold(dev);
dev->reset_temp_active = false;
} }
while (!g_failed && g_temperature_done < g_num_devs) { while (!g_failed && g_temperature_done < g_num_devs) {
@ -468,7 +478,9 @@ spdk_aer_temperature_test(void)
/* Waiting for AEN to be occur here. Each device will increment g_aer_done on an AEN */ /* Waiting for AEN to be occur here. Each device will increment g_aer_done on an AEN */
while (!g_failed && (g_aer_done < g_num_devs)) { while (!g_failed && (g_aer_done < g_num_devs)) {
foreach_dev(dev) { foreach_dev(dev) {
spdk_nvme_ctrlr_process_admin_completions(dev->ctrlr); if (spdk_nvme_ctrlr_process_admin_completions(dev->ctrlr) < 0) {
g_failed = 1;
}
} }
} }