test/bdev: initialize descriptor array in open_write_test
A later patch in this series fails the test pool because scan-build says we might be using garbage for one of the descriptor pointer comparisons. That later patch does not touch this unit test file at all, and the bdev-related changes do not touch the code path used around the bug report. But the report is valid - it's possible that with the additional bdev.c changes that scan-build's ability to detect this bug changed for the better. Signed-off-by: Jim Harris <james.r.harris@intel.com> Change-Id: I2bf165fe4d91a13d481010176a0339b591b16014 Reviewed-on: https://review.gerrithub.io/378825 Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com> Tested-by: SPDK Automated Test System <sys_sgsw@intel.com> Reviewed-by: Ben Walker <benjamin.walker@intel.com>
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@ -187,7 +187,7 @@ static void
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open_write_test(void)
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{
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struct spdk_bdev *bdev[8];
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struct spdk_bdev_desc *desc[8];
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struct spdk_bdev_desc *desc[8] = {};
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int rc;
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/*
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